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Up for sale is (1) Samsung 860 EVO 4TB 2.5" SATA III Internal SSD MZ-76E4T0 Solid State Drive
Condition: Used, tested with zero errors. Reporting 99-100% health.Pictures are of the exact item listed.
Any questions, please ask. Happy to oblige.
Smart report below:
# smartctl -a /dev/sdbsmartctl 7.5 2025-04-30 r5714 [x86_64-linux-7.0.14-16-pve] (local build)Copyright (C) 2002-25, Bruce Allen, Christian Franke
=== START OF INFORMATION SECTION ===Model Family: Samsung based SSDsDevice Model: Samsung SSD 860 EVO 4TBSerial Number: S3YNNB0M303062WLU WWN Device Id: 5 002538 e40e93c2aFirmware Version: RVT04B6QUser Capacity: 4,000,787,030,016 bytes [4.00 TB]Sector Size: 512 bytes logical/physicalRotation Rate: Solid State DeviceForm Factor: 2.5 inchesTRIM Command: Available, deterministic, zeroedDevice is: In smartctl database 7.5/5706ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)Local Time is: Mon Sep 14 16:55:36 2026 EDTSMART support is: Available - device has SMART capability.SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===SMART overall-health self-assessment test result: PASSED
General SMART Values:Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled.Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run.Total time to complete Offlinedata collection: ( 0) seconds.Offline data collectioncapabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported.SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer.Error logging capability: (0x01) Error logging supported. General Purpose Logging supported.Short self-test routinerecommended polling time: ( 2) minutes.Extended self-test routinerecommended polling time: ( 320) minutes.SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported.
SMART Attributes Data Structure revision number: 1Vendor Specific SMART Attributes with Thresholds:ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0 9 Power_On_Hours 0x0032 091 091 000 Old_age Always - 4535812 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 59177 Wear_Leveling_Count 0x0013 094 094 000 Pre-fail Always - 77179 Used_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 0181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0187 Uncorrectable_Error_Cnt 0x0032 100 100 000 Old_age Always - 0190 Airflow_Temperature_Cel 0x0032 071 053 000 Old_age Always - 29195 ECC_Error_Rate 0x001a 200 200 000 Old_age Always - 0199 CRC_Error_Count 0x003e 099 099 000 Old_age Always - 339235 POR_Recovery_Count 0x0012 099 099 000 Old_age Always - 44241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 288505202863
SMART Error Log Version: 1No Errors Logged
SMART Self-test log structure revision number 1No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testingSelective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk.If Selective self-test is pending on power-up, resume after 0 minute delay.
